Equipment
- Light Scattering
3D-PCCS
Photon Cross Correlation Spectroscopy (PCCS) is a powerful extension of the well established Photon Correlation Spectroscopy (PCS). While PCS is limited to highly diluted systems, with PCCS it is possible to study multiple scattering systems like suspensions or emulsions.
Model: 3D-PCS (LS Instruments) equipped with a He-Ne laser (Thorlabs, wavelength 632.8 nm)
2D-PCS
Goniometer setup:
The setup is equipped with a multiple-τ digital correlator (ALV-Laser Vertriebsgesellschaft mbH, Langen, Germany) and an argon-ion laser; λ = 514.5 nm) as light source.
Model: ALV-5000 goniometer setup + Spectra Physics argon ion laser (Stabilite 2017) (ALV GmbH )
2D-PCS
Fixed angle setup:
Self-build setup with a fixed light scattering detection at an angle of 60°. The used light source is an He-Ne laser with a wavelength of 632.8 nm.
Model: ALV-5000E correlator; scattering angle: 60°; He-Ne laser (Thorlabs, continuous output 21mW)HT-LS
High temperture setup:
Self-build setup with a goniomter and a ALV 7004/USB correlator combined with ALV / LSE-5004 software. The light source is a COMPASS DPSS Laser from Coherent with a wavelengh of 532 nm and 100 mW power. The housing of the index matching bath is made of teflon.
DDLS
Depolarized Dynamic Light Scattering
Sample Enviroment for SKADI, ESS Lund
In the framework of the development of the European Spallation Source (ESS) in Lund a sample environment combining in-situ dynamic light scattering (DLS), diffusing wave spectroscopy (DWS) and small angle neutron scattering (SANS) will be developed using an universal carrier system.
A fibre optical setup with a HeNe laser light source (λ=633 nm) and three phtoton counting detectors will be employed which allows the usage of a sample changer with external temperature control.
DLS measurments can be carried out at two different q vectors in forward and backscattering geometry. As DLS measurements are limited to highly diluted samples the installation of a DWS unit in transmission mode will also allow the invesigation of turbid samples.
- Electron microscopy
Cryo-TEM
Model: JEOL JEM-2200FS
Acceleration voltage: 80 – 200kV
ZrO/W(100) Schottky-Emitter
Piezo controlled sample stage
TEM-point resolution at 200 kV: 0,23 nm
In-column energy filter for EFTEM and EELS, energy resolution: 0,8 eV (zero-loss FWHM)
EDX with SDD-Detektor (JEOL)
4k x 4k CMOS-Camera (Gatan OneView)
STEM BF- und DF-Detectors
Single-tip, analytical double-tip, tomography, heating and cryotransfer specimen holdersContact: Yvonne Hannappel
SEM
Details: The ESEM from Philips combines the well established functions of a conventional SEM (high vacuum) with the possibility of an environmental (ESEM) mode. This technology permits the imaging of samples with a relative humidity up to 100% under low-vacuum conditions. The SEM is equipped with a field emission gun as electron source leading to a resolution of 1-2 nm. Moreover, the XL 30 has an Energy Dispersive X-Ray Analyser (EDX) for quantitative and qualitative chemical analysis.
Model: Philips XL30 with EDAX Phoenix system
Contact: Uwe Güth
- SAXS/WAXS System
Details: The Xeuss SAXS/WAXS System from Xenocs constists of a GeniX 3D Cu Ultra low divergence source, a collimation system composed of two scatterless slits and a Pilatus 300K Detector from Dectris, 20 Hz. We use the system to analyse and resolve structures from various samples ranging from 0.5 to 120 nm. The system covers experiments including WAXS/SAXS, GISAXS, and Reflectometry.
Model: Xeuss SAXS/WAXS System
Contact:
- Surface and Interface Characterisation
Ellipsometry
The SE 400adv from Sentech is a laser ellipsometer with a sabilized HeNe laser. The ellipsometer can be used to measure the thickness of a single layer film with a precision of up to 0.1 Å. For multiple angle measurements the angle of incidence can be varied from 40° - 90° in 5° steps. Furthermore the ellipsometer can be mounted with a liquid cell.
Model: Sentech SE 400adv
AFM
Tensiometer
Model:
Contact:
Contact angle and Pendent Drop
Spinning Drop
- Time-resolved confocal fluorescence microscope
The Microtime 200 Time-resolved confocal fluorescence microscope combines the usual confocal setup with a high time resolution (down to ~10 ps). The confocal setup consists of 4 different laser lines (405, 485, 510 and 640 nm), the respective dichroic mirrors (the wavelengths of 485 and 640 nm can be measurements simultaneously with a two-band dichroic) the Olympus IX71 inverted microscope (equipped with a 60x water objective) and different pinholes. A Picoharp 300 together with two Avalanche Photo diodes make up the detection system. Together with a piezo sample stage, this setup allows for example: TCSPC, FLIM, FCS and fluorescence anisotropy.
Model: PicoQuant MicroTime 200
Contact: Andreas Brockhinke
- Spectrometer
FT-Infrared Spectrometer
Model: Bruker IFS 66v + pulsed Nd:YAG laser (Spectra Physics GCR-12) + OPO (OPTA)
Contact: AG Tilman Kottke
UV/Vis Spectrometer
- Flash Photolysis with Intensified CCD Camera
- Rheometer with small angle light scattering option (Rheo-SALS)
The available Physica MCR 101 can be used for various rheological measurements such as oscillatory or steady shear experiments (parallel plate, cone plate or cylinder geometry). With the additional light scattering setup the structure formation in diluted polymer solutions with an applied shear strain can be analyzed. The accompanying software offers an immediate evaluation and graphical display of experimental results.
Model: Physica MCR 101 with 658 nm laser (Anton Paar)
