Photon Cross Correlation Spectroscopy (PCCS) is a powerful extension of the well established Photon Correlation Spectroscopy (PCS). While PCS is limited to highly diluted systems, with PCCS it is possible to study multiple scattering systems like suspensions or emulsions.

Model: 3D-PCS (LS Instruments) equipped with a He-Ne laser (Thorlabs, wavelength 632.8 nm)

Goniometer setup:

The setup is equipped with a multiple-τ digital correlator (ALV-Laser Vertriebsgesellschaft mbH, Langen, Germany) and an argon-ion laser; λ = 514.5 nm) as light source.
Model: ALV-5000 goniometer setup + Spectra Physics argon ion laser (Stabilite 2017) (ALV GmbH )

Fixed angle setup:

Self-build setup with a fixed light scattering detection at an angle of 60°. The used light source is an He-Ne laser with a wavelength of 632.8 nm.
Model: ALV-5000E correlator; scattering angle: 60°; He-Ne laser (Thorlabs, continuous output 21mW)

High temperture setup:

Self-build setup with a goniomter and a ALV 7004/USB correlator combined with ALV / LSE-5004 software. The light source is a COMPASS DPSS Laser from Coherent with a wavelengh of 532 nm and 100 mW power. The housing of the index matching bath is made of teflon.

Depolarized Dynamic Light Scattering

In the framework of the development of the European Spallation Source (ESS) in Lund a sample environment combining in-situ dynamic light scattering (DLS), diffusing wave spectroscopy (DWS) and small angle neutron scattering (SANS) will be developed using an universal carrier system.

A fibre optical setup with a HeNe laser light source (λ=633 nm) and three phtoton counting detectors will be employed which allows the usage of a sample changer with external temperature control.

DLS measurments can be carried out at two different q vectors in forward and backscattering geometry. As DLS measurements are limited to highly diluted samples the installation of a DWS unit in transmission mode will also allow the invesigation of turbid samples.

Model: JEOL JEM-2200FS

Acceleration voltage: 80 – 200kV
ZrO/W(100) Schottky-Emitter
Piezo controlled sample stage
TEM-point resolution at 200 kV: 0,23 nm
In-column energy filter for EFTEM and EELS, energy resolution: 0,8 eV (zero-loss FWHM)
EDX with SDD-Detektor (JEOL)
4k x 4k CMOS-Camera (Gatan OneView)
STEM BF- und DF-Detectors
Single-tip, analytical double-tip, tomography, heating and cryotransfer specimen holders

Contact: Yvonne Hannappel

User services

Details: The Phenom proX-G3 from IB-FT company is a small Desktop scanning electron microscope (SEM) which allows quick and easy measurments. The magnification ranges from 20- to 45000 times with an acceleration voltage between  5,10 or 15kV. The SEM is equipped with a backscattering detector (BSE) with topographic contrast mode and also with a energy dispersive X-ray detector (EDX) for element- detection, -quantification and mapping.

For the investigation of samples with a low electric conductivity it is often necessary to coat the sample with a thin film of metal. We use a Polaron E-5000 sputter coater unit with a palladium target.

Model: IB-FT (Thermo) Phenom proX-G3 with BSE and EDX and Polaron E-5000 sputter coater (Pd)

Contact: Uwe Güth

REM_Nutzerordnung_2024.pdf

The SE 400adv from Sentech is a laser ellipsometer with a sabilized HeNe laser. The ellipsometer can be used to measure the thickness of a single layer film with a precision of up to 0.1 Å. For multiple angle measurements the angle of incidence can be varied from 40° - 90° in 5° steps. Furthermore the ellipsometer can be mounted with a liquid cell.

Model: Sentech SE 400adv

Model: Nanosurf FlexAFM

Contact: Marco Annegarn

Model:

Contact:

Model: Bruker IFS 66v + pulsed Nd:YAG laser (Spectra Physics GCR-12) + OPO (OPTA)

Contact: AG Tilman Kottke